Seminar 2008 03 26 Computer Assisted Diagnosis

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CISST ERC Seminar
Challenges and Developments of Computer Assisted Diagnosis

Date: Wednesday, March 26, 2008
Time: 12:00pm
Place: CSEB B17 (Lunch will be served at 11:30am)

Speaker: Thomas Wittenberg
Fraunhofer IIS
Title: Challenges and Developments of Computer Assisted Diagnosis
Presentation: PDF, not yet uploaded

Abstract

Image-Based Computer Assisted Diagnosis (CAD) has a long tradition within medical informatics, since 30 years ago the first attempts have been made to use computers for an automatic analysis of mammographs and chest radiographs. Within CAD-systems, two main challenges have to be dealt with, namely the computer assisted detection of lesions with in an image or image stack (commonly also referred to as CADe) and the computer assisted diagnosis (referred to as CADx) of such detected lesions. Using mammography, dermatoscopy and endoscopy as application examples, this presentation will give an overview over currently existing challenges and developments within CAD-systems

Bio

Dr. Thomas Wittenberg (1964) studied Computer Science at the Christopher Newport University, Newport News, VA, USA, and the Friedrich-Alexander-University Erlangen-Nuremberg. Germany. He received his Diploma degree in Informatics in 1992. From 1992 to 1993, he worked as software developer at the Fraunhofer Institute for Integrated Circuits IIS in the department for Electronic Systems. From 1993 until 1999 he worked as scientific researcher in the department of Phoniatrics and Pediatric Audiology at the Ear-Nose-Throat (ENT) clinic of the University Erlangen, Germany. 1998 he became scientific senior assistant and technical head of the voice research laboratory. In 1998 he received a PhD in Engineering from the chair of Technical Electronics with a thesis on "Knowledge-Based Semi-Automatic Motion Analysis of Vocal Fold Vibrations Based on Digital High-Speed Camera Recordings". Since 1999 Dr. Wittenberg has been heading the group "Medical Image Processing and Computer Assisted Diagnosis" at the Fraunhofer-Institute for Integrated Circuits IIS. He is also external lecturer at the chair of Pattern Recognition at the Erlangen University.